Your selections:
A highly contrasting scanning helium microscope
- Fahy, A., Barr, M., Martens, J., Dastoor, P. C.
High-stroke silicon-on-insulator MEMS nanopositioner: control design for non-raster scan atomic force microscopy
- Maroufi, Mohammad, Fowler, Anthony G., Bazaei, Ali, Moheimani, S. O. Reza
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